AE8200 Series Optical Wavelength Meter
The AE8200 Series Optical Wavelength Meter establishes a new benchmark in high-precision optical wavelength measurement, delivering exceptional accuracy of ±0.2 ppm across a wide spectral range of 900 to 1700 nm. Built on advanced Michelson interferometry combined with FFT-based signal processing, the AE8200 ensures precise analysis of both single-wavelength and complex multi-wavelength optical signals. This instrument is ideal for demanding applications including DWDM systems, tunable laser characterization, optical transceiver testing, and calibration of optical test equipment. Its high-speed performance, robust stability, and open data interface make it perfectly suited for automated testing environments in research laboratories, photonics manufacturing, and optical communications.
- Ultra-high wavelength accuracy: ±0.2 ppm for precise optical measurements
- Wide spectral range: 900 to 1700 nm
- Simultaneous measurement: Up to 1024 wavelengths
- Fast measurement speed: ≤ 0.2 seconds
- Advanced interferometric measurement: Based on Michelson interferometry
- FFT signal processing: Accurate analysis of multi-channel optical signals
- Built-in WDM and FP laser analysis functions
- High-resolution measurement: Minimum resolvable line separation of 5 GHz
- 7-inch capacitive touchscreen: Intuitive operation and enhanced productivity
- Flexible connectivity: Ethernet, USB, GPIB, and automated system integration
- Open data interface: Ideal for automated optical test systems
- Tunable Laser and Optical Transceiver Testing
- WDM Transmission Systems
- Calibration and Optical Test System Validation
| Parameter | Specification |
|---|---|
| Wavelength Range | 900 – 1700 nm |
| Wavelength Accuracy | ±0.2 ppm |
| Maximum Number of Wavelengths | 1024 |
| Measurement Time | ≤ 0.2 seconds |
| Minimum Line Separation | 5 GHz |
| Display | 7-inch capacitive touchscreen |
| Interfaces | Ethernet, USB, GPIB |
| Dimensions | 440 × 133 × 480 mm |
| Weight | Approx. 15 kg |
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