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GA‑355‑100mW – 355 nm Laser for Marking

The GA-355-100mW is a 355 nm UV laser source designed for high-precision laser marking and micro-processing applications. Featuring high peak power, short pulse duration, and a high repetition rate, this passively Q-switched laser delivers excellent performance for demanding industrial and scientific tasks. With a TEM₀₀ beam profile, low beam divergence, and high polarization purity, the GA-355-100mW ensures fine feature resolution and stable processing quality. Its compact design and fast warm-up time make it ideal for laser marking systems, 3D marking, sub-surface engraving, instrumentation, and biological research.

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Features
  • 355 nm UV laser source for laser marking
  • Passively Q-switched operation
  • Short pulse duration (~3 ns)
  • High peak power (up to 15 kW)
  • High repetition rate (~20 kHz)
  • Excellent beam quality (TEM₀₀)
  • Low beam divergence (~1 mrad)
  • High polarization ratio (>100:1)
  • Compact and stable design
  • Fast warm-up time (<15 minutes)
Applications
  • Laser marking and engraving
  • 3D laser marking
  • Sub-surface engraving
  • Precision micro-processing
  • Scientific research
  • Biology and instrumentation
  • OEM laser marking systems
Specifications
Parameter Specification
Wavelength 355 ± 1 nm
Operating Mode Passively Q-switched
Average Power 1 – 1000 mW
Single Pulse Energy 1 – 40 µJ
Pulse Duration ~3 ns
Peak Power 1 – 15 kW
Repetition Rate ~20 kHz
Transverse Mode TEM₀₀
Beam Divergence (full angle) ~1.0 mrad
Beam Diameter at Aperture (1/e²) ~6.0 mm
Polarization Ratio >100:1 (Vertical)
Beam Height from Base Plate 23.5 mm
Warm-up Time <15 minutes
Operating Temperature 10 – 35 °C
Power Supply 12 V DC (QDI-GA-GFS / QDI-GA-PRZ, 12V/25A)