Kaleo MultiWAVE – Multi-Wavelength Optical Metrology System
The Kaleo MultiWAVE from Phasics is an advanced optical metrology instrument designed to measure both transmitted and reflected wavefront errors (TWE/RWE) across a broad spectral range—from UV to LWIR (190 nm – 14 µm). It enables precise characterization of coated and uncoated optics up to 130 mm in diameter, providing accuracy comparable to high-end Fizeau interferometers.
With the capability to integrate multiple wavelengths into a single test bench, the Kaleo MultiWAVE offers a cost-effective, flexible alternative to multiple interferometric setups, ensuring reliable measurements in R&D, quality control, and production environments.
Features
- Broad spectral coverage from 190 nm to 14 µm (UV – VIS – NIR – SWIR – MWIR – LWIR)
- Simultaneous TWE and RWE measurement for transparent and reflective optics
- Supports multiple wavelengths on the same bench (up to 8 custom channels)
- High measurement accuracy comparable to Fizeau interferometry
- Nanometric phase resolution and large dynamic range (> 500 fringes)
- No vibration isolation required thanks to robust self-referenced design
- Compact and stable configuration with real-time alignment and phase display
Applications
- Optical component metrology (lenses, mirrors, coatings)
- Quality control in optical manufacturing
- Multi-wavelength system alignment and calibration
- Laser optics inspection and testing
- R&D in aerospace, defense, and semiconductor industries
Specifications
| Parameter | Specification |
|---|---|
| Configuration | Double pass |
| Measurement capability | TWE (transparent optics), RWE (reflective surfaces) |
| Number of wavelengths per instrument | 1 or 2 (standard), up to 8 (custom) |
| Custom wavelengths | Any from 193 nm to 14 µm |
| Typical wavelengths | UV: 266, 355, 405 nm / VIS-NIR: 550, 625, 780, 940, 1050 nm / IR: 1.55, 2.0, 3.39, 10.6 µm |
| Clear aperture | 130 mm (5.1") |
| Beam height | 108 mm |
| Alignment system | Live phase & Zernike coefficients display |
| Polarization | Compatible with depolarizing optics |
| Alignment FOV | ±2° |
| Pupil focus range | ±2.5 m |
| Dimensions / Weight | 910 × 600 × 260 mm³ / 25 kg |
| RMS repeatability | < 0.7 nm (< λ / 900) |
| Sample reflectivity range | ~4% – 100% |
| Vibration isolation | Not required |
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