NANOVEA JR100 Ultrafast Portable Profilometer

The NANOVEA JR100 Ultrafast Portable Profilometer redefines portable surface measurement by combining exceptional speed, portability, and accuracy into a compact, lightweight device. Equipped with a 100 x 100 mm X-Y axis travel stage, this profiler performs continuous, non-contact 2D and 3D scans without the need for stitching, delivering ultrafast data acquisition at 384,000 points per second. Weighing only 17 kg and built with a minimal footprint, the JR100 can be easily transported to production lines, research labs, or field locations for real-time surface inspection and quality control. Whether evaluating roughness, step height, texture, form, or volume, the JR100 ensures reliable, high-resolution data across a wide range of materials and geometries

100 x 100 mm X-Y Axis Travel — Provides large-area, continuous surface scanning without stitching.
384,000 Points/Second Scanning Speed — Ultrafast data acquisition ensures accurate 2D/3D measurements in minimal time.
Lightweight and Portable (17 kg) — Compact design allows easy transportation and setup anywhere—perfect for production floors, labs, or fieldwork.
True Non-Contact Measurement — Delivers precise height, texture, and roughness data without damaging the surface.
Complete 2D and 3D Profilometry — Supports comprehensive surface characterization, including roughness, form, grain, step height, volume, and area.
High-Speed Sensor Technology — Ensures rapid, repeatable, and reliable quality control results in industrial or research environments.
No Stitching Required — Delivers full-area measurements in a single scan for faster, more accurate reporting.
Ideal for On-Site Quality Control — Enables real-time defect detection, process optimization, and surface validation on the spot.