NANOVEA JR25 Portable Compact Optical Profilometer
The NANOVEA JR25 Portable Compact Optical Profilometer redefines portable surface analysis by offering lab-grade 2D and 3D non-contact profilometry in a compact, handheld system. Built with Chromatic Confocal Light Technology, the JR25 delivers precise measurements of roughness, texture, grain, geometry, step height, thickness, volume, area, flatness, and warpage—on any surface, whether transparent or opaque. Its rotating scanning head and lightweight design enable surface profiling in hard-to-reach or complex environments, making it the ideal tool for in-situ research, production QC, and on-site inspection where large, stationary systems are impractical. The JR25 provides fast, accurate, and repeatable data across various materials and surfaces without physical contact, ensuring both versatility and durability. Multiple configurations are available, including Portable Standard, Portable High-Speed, Modular Large Area, and Compact Standard, offering tailored solutions for specific research or industrial needs.
- Chromatic Confocal Light Technology — Measures physical wavelengths for unmatched height and surface profile accuracy on transparent or opaque materials.
- Complete Portability — Lightweight, compact, and field-ready design allows in-situ surface analysis even in complex or restricted environments.
- Rotary Scanning Head — Expands measurement capability on irregular, curved, or hard-to-access surfaces.
- 2D & 3D Profilometry — Capture surface data in high-resolution 2D or full 3D maps for comprehensive analysis.
- Multi-Surface Versatility — Suitable for roughness, grain, texture, form, step height, thickness, flatness, warpage, and volume measurements.
- Modular Configurations Available — Options include Portable High-Speed,
- Modular Large Area, and Compact Standard to match specific application needs.
- Non-Contact Measurement — Ensures damage-free testing of delicate, coated, or polished surfaces without sample preparation.
- Lab-Quality Accuracy in the Field — Ideal for quality control, failure analysis, and research in automotive, aerospace, medical devices, semiconductors, and more.
- Industrial Quality Control (QC)
- Aerospace and Automotive Surface Inspection
- Microelectronics and Semiconductor Profiling
- Medical Device Surface Analysis
- Research & Development Laboratories
- Coatings and Thin Film Characterization
- Material Science Studies
| STANDARD SENSOR SINGLE POINT | PS1 | PS2 | PS3 | PS4 | PS5 | PS6 |
|---|---|---|---|---|---|---|
| MAX HEIGHT RANGE | 110 μm | 300 μm | 1.1 mm | 3.5 mm | 10 mm | 24 mm |
| WORKING DISTANCE | 3.3 mm | 10.8 mm | 12.2 mm | 16.5 mm | 26.6 mm | 20 mm |
| LATERAL X - Y ACCURACY | 0.8 μm | 1.7 μm | 2.6 μm | 4.6 μm | 11.0 μm | 11.0 μm |
| HEIGHT REPEATABILITY* | 1.9 nm | 5.4 nm | 15.8 nm | 31.6 nm | 117.0 nm | 237.2 nm |
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