PI Neph: Advanced Particle Characterization
PI Neph (Polar Imaging Nephelometer) is a high-end laboratory instrument designed for advanced particle characterization using hyperangular light scattering measurements. It offers precise retrieval of aerosol properties such as size distribution, complex refractive index, and percent sphericity by capturing scattering intensities from 3° to 176° with an angular resolution of <1°. The standard model includes two visible wavelengths, with options to configure one to three. Equipped with the powerful GRASP™ software package, PI Neph enables detailed inversion analysis and supports multi-source aerosol parameter retrieval. Due to its advanced capabilities, the PI Neph is recommended for expert users and includes comprehensive training to unlock its full analytical potential. It is ideal for laboratory research, instrument development, and airborne particulate studies.
- High-resolution angular scattering: 3° to 176°
- Angular resolution <1°
- Measures both polarized and non-polarized light
- Standard 2 visible wavelengths; customizable for 1–3
- Full particle characterization: size, refractive index, sphericity
- Hyperangular scattering for increased sensitivity
- GRASP™ software for inversion and analysis included
- Suitable for both lab and airborne configurations
- Advanced aerosol laboratory research
- Airborne particulate analysis (research aircraft)
- Optical property characterization of environmental particles
- Model validation for satellite aerosol retrieval
- Instrument calibration and development
- Fundamental light scattering studies
| Specification | Details |
|---|---|
| Scattering angle range | 3° to 176° |
| Angular resolution | <1° |
| Wavelengths | Standard 2 (visible); customizable 1–3 wavelengths |
| Polarization capability | Yes (measures polarized scattering) |
| Optical measurements | Hyperangular light scattering intensity |
| Data analysis software | GRASP™ included (size, sphericity, refractive index retrieval) |
| Primary output parameters | Size distribution, complex refractive index, sphericity |
| Suggested use cases | Laboratory research, aircraft studies, advanced optical analysis |
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