SID4 eSWIR HR – Extended SWIR Wavefront Sensor
The Phasics SID4 eSWIR HR is a high-resolution, extended short-wave infrared (eSWIR) wavefront sensor designed for applications in the 1.2–2.1 µm spectral range.
Integrating Phasics’ patented wavefront sensing technology with a T2SL detector, this sensor is the only high-resolution solution capable of measuring wavefronts across the full extended SWIR spectrum.
Its combination of high sensitivity, robust self-referenced architecture, and compact design makes it ideal for testing SWIR sources and optics used in optical communications, inspection systems, night vision, and defense applications.
Features
- Extended spectral coverage: 1.2 – 2.1 µm
- High-resolution wavefront measurement: 159 × 127 phase pixels
- Compact, vibration-insensitive, self-referenced design
- Ideal for SWIR and eSWIR laser and imaging systems
- Fast real-time acquisition and processing (10 Hz)
- Compatible with optical communication and infrared inspection setups
Applications
- SWIR and eSWIR laser source testing
- Optical system alignment and metrology
- Adaptive optics and wavefront correction
- Optical communications and fiber system diagnostics
- Night vision, defense, and surveillance optics testing
- IR lens inspection and characterization
Specifications
| Parameter | Specification |
|---|---|
| Spectral range | 1.4 – 2.1 µm (extended SWIR 1.2 – 2.1 µm) |
| Aperture dimension | 9.54 × 7.62 mm² |
| Spatial resolution | 60 µm |
| Phase & intensity sampling | 159 × 127 |
| Phase resolution (RMS) | < 6 nm* |
| Absolute accuracy (RMS) | < 40 nm* |
| Real-time processing frequency | 10 Hz (full resolution) |
| Interface | Giga Ethernet |
| Dimensions (W × H × L) | 90 × 115 × 120 mm³ |
| Weight | ~1 kg |
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